Cesta:OKDatasheet > Semiconductor list > TI Datasheet > SN74BCT8374ADWR
SN74BCT8374ADWR spec: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
Cesta:OKDatasheet > Semiconductor list > TI Datasheet > SN74BCT8374ADWR
SN74BCT8374ADWR spec: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
Výrobcem : TI
Balení : DW
Špendlíky : 24
Teplota : Min 0 °C | Max 70 °C
Velikost : 323 KB
Aplikace : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS