Cesta:OKDatasheet > Semiconductor list > TI Datasheet > SNJ54BCT8240AFK
SNJ54BCT8240AFK spec: SCAN TEST DEVICES WITH OCTAL BUFFERS
Cesta:OKDatasheet > Semiconductor list > TI Datasheet > SNJ54BCT8240AFK
SNJ54BCT8240AFK spec: SCAN TEST DEVICES WITH OCTAL BUFFERS
Výrobcem : TI
Balení : FK
Špendlíky : 28
Teplota : Min -55 °C | Max 125 °C
Velikost : 322 KB
Aplikace : SCAN TEST DEVICES WITH OCTAL BUFFERS