SNJ54BCT8240AFK Podobné

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    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
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    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5401W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
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    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
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    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SNJ54BCT8240AFK Datasheet a Spec

Výrobcem : TI 

Balení : FK 

Špendlíky : 28 

Teplota : Min -55 °C | Max 125 °C

Velikost : 322 KB

Aplikace : SCAN TEST DEVICES WITH OCTAL BUFFERS 

SNJ54BCT8240AFK PDF Download

SNJ54BCT8240AFK PDF