SN74ABT3614-30PQ Podobné

SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
SN74LVTH16652DLR
- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT3614-30PQ Datasheet a Spec

Výrobcem : TI

Balení : PQ

Špendlíky : 132

Teplota : Min 0 °C | Max 70 °C

Velikost : 699 KB

Aplikace : 64 X 36 X 2 BIDIRECTIONAL SYNCHRONOUS FIFO MEMORY